SemiProbe Application Case Studies
This page has links to customer application case studies, showing a selection of different wafer probing configurations and processes. These include High Frequency, MEMS, Optoelectronic, Silicon Photonic, Vacuum, Device Characterization, Magnetic Stimulation, Microfluidic, and High Power probe testing.
The systems detailed are installed worldwide in customer facilities in either manual, semiautomatic or fully automatic configurations.
To view specific case studies, please select either the level of automation “Probe System Type” (i.e. Manual, Semiautomatic or Fully Automatic) and/or the “Application”. Note: the default view shows all of the example applications.
Semiautomatic PS4L Wafer Probe Station for Device Characterization
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Semiautomatic PS4L Wafer Probe Station for High Frequency Thermal Test
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Manual PS4L Wafer Probe Station for High Frequency Test
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Automatic PS4L Wafer Probe Station for High Frequency 5G Test
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Manual LAB Assistant Wafer Probing System for High Frequency Testing
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Manual LAB Assistant Wafer Probe Station for Device Characterization
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Automatic PS4L Wafer Prober for Device Characterization
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Manual PS4L Vacuum Wafer Probe Station for High Voltage Test
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Manual PS4L 3kV High Power Wafer Probe Station
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Semiautomatic PS4L 300mm High Voltage Wafer Prober
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Semiautomatic PS4L Wafer Probe Station 10kV High Power Test
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LAB Assistant High Power Manual Wafer Probe Station
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Manual LAB Assistant Probe Station for Magnetic Stimulation
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Manual PS4L Wafer Probe Station for Magnetic Stimulation
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Semiautomatic PS4L Wafer Probe Station for Microfluidic MEMS Testing
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Semiautomatic PS4L Wafer Probe Station for Microfluidic MEMS Test
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Automatic PS4L Vacuum Wafer Probe Station
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Fully Automatic MEMS Vacuum Wafer Probing
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Semiautomatic MEMS Vacuum Wafer Probe Station
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Fully Automatic MEMS Wafer Probe Station
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Manual PS4L MEMS Wafer Probe Station
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Manual PS4L Double Sided Optoelectronic Wafer Probe Station
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Semiautomatic LED Wafer Probe Tester
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Semiautomatic PS4L 300mm Silicon Photonic Probe Station
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Semiautomatic VCSEL Diode Wafer Probe Station
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Double Sided Wafer Prober For Silicon Photonic Device Testing
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Semiautomatic Double Sided Wafer Prober
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Fully Automatic Silicon Photonic Probe Station with Hexapods
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Manual LAB Assistant Wafer Probe Station with Test Instruments
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Semiautomatic Double Sided Optoelectronic Wafer Prober
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Semiautomatic PS4L Wafer Probe Station for Magnetic Stimulation
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Semiautomatic Magnetic Stimulation & Thermal Test Probe Station
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Fully Automatic MEMS Vacuum Wafer Prober
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Manual LAB Assistant for High Frequency Wafer Probing
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Manual PS4L High Power 200mm Wafer Probe Station
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Further Information
Applications
Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Microfluidic Testing, Photovoltaic Device Test etc.
Industry Segments
Semiconductor Research and Development, Device Characterisation, Production Test, Semiconductor Wafer Probe Test etc.
SemiProbe Website
Region
Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.
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