Inseto

Specific Requirements:

The European customer wanted a fully automatic probe station to test silicon photonic devices in wafer form that were manufactured using MEMS technology. Due to small pitches and tight tolerances the customer needed four programmable manipulators. Two manipulators were multi-axis hexapods and two were three-axis manipulators. The two hexapod manipulators had probe arms that could handle single and multi-mode fibers. The fiber needed to be placed within 10 um of the device surface so non-contact height measurement sensors were required and mounted to the fiber arms. The two three-axis manipulators used single DC or high frequency (HF) probe arms with the appropriate probe tips.

SemiProbe Solution:

  • FA-6 Fully automatic 150 mm probe system:
    • 150 mm programmable X,Y,Z and theta stage
    • PILOT Software Suite – Navigator, Wafer Map and Autoalign
  • Four programmable manipulators:
    • Two multi-axis Smartacts Hexapod’s for light input and output optimization
    • Two three axis manipulators with DC & HF probes HF, DC and Optoelectronic probe arms and probes
    • Non-Contact Height Measurement Sensor
  • Material Handling Unit: two cassettes, pre-aligner, scanner, bar code reader
  • Motorized zoom tube optics
  • Test Instrumentation Racks

Other Application Case Studies

Probe System Type

Application

Manual PS4L High Power 200mm Wafer Probe Station

Manual High Power 200mm Wafer Probe Station

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Manual LAB Assistant for High Frequency Wafer Probing

High Frequency Wafer Probing Case Study

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Fully Automatic MEMS Vacuum Wafer Prober

Fully Automatic MEMS Vacuum Wafer Probe Station

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Semiautomatic Magnetic Stimulation & Thermal Test Probe Station

Semiautomatic Magnetic Stimulation Wafer Probe Station with Thermal Test

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Semiautomatic PS4L Wafer Probe Station for Magnetic Stimulation

Semiautomatic Magnetic Stimulation Wafer Probe Station

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Semiautomatic Double Sided Optoelectronic Wafer Prober

Double-Sided (DSP) Optoelectronic Wafer Prober

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Manual LAB Assistant Wafer Probe Station with Test Instruments

Manual Wafer Probe with Test Instrumentation

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Fully Automatic Silicon Photonic Probe Station with Hexapods

Automatic Optoelectronic Wafer Probe Station

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Semiautomatic Double Sided Wafer Prober

Semiautomatic Double Sided Optoelectronic Wafer Probe Station

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Double Sided Wafer Prober For Silicon Photonic Device Testing

Fully Automatic Double Sided Silicon Photonic Probe Station

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Semiautomatic VCSEL Diode Wafer Probe Station

Semiautomatic VCSEL Diode Wafer Probe Station

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Semiautomatic PS4L 300mm Silicon Photonic Probe Station

Semiautomatic PS4L 300mm Silicon Photonic Testing

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Semiautomatic LED Wafer Probe Tester

LED Wafer Probe Tester

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Manual PS4L Double Sided Optoelectronic Wafer Probe Station

Manual Double Sided Optoelectronic Probe Station

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Manual PS4L MEMS Wafer Probe Station

MEMS Manual Wafer Probing Systems

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Fully Automatic MEMS Wafer Probe Station

Fully automatic 200mm MEMS Wafer Probe Station

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Semiautomatic MEMS Vacuum Wafer Probe Station

200mm Vacuum MEMS Wafer Probe Station

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Fully Automatic MEMS Vacuum Wafer Probing

Fully Automatic MEMS Vacuum Wafer Probe Station

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Automatic PS4L Vacuum Wafer Probe Station

Fully Automatic 150mm MEMS Vacuum Wafer Probe Station

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Semiautomatic PS4L Wafer Probe Station for Microfluidic MEMS Test

Microfluidic 200mm Wafer Probe Station

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Semiautomatic PS4L Wafer Probe Station for Microfluidic MEMS Testing

Microfluidic Wafer Probe Station

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Manual PS4L Wafer Probe Station for Magnetic Stimulation

Magnetic Stimulation Manual Wafer Probe Station

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Manual LAB Assistant Probe Station for Magnetic Stimulation

Magnetic Stimulation Manual Wafer Probe Station

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LAB Assistant High Power Manual Wafer Probe Station

Affordable High Power Manual Probe Station

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Semiautomatic PS4L Wafer Probe Station 10kV High Power Test

Semiautomatic PS4L 10KV High Power Vacuum Wafer Probe Station

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Semiautomatic PS4L 300mm High Voltage Wafer Prober

Semiautomatic Wafer Probing Equipment

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Manual PS4L 3kV High Power Wafer Probe Station

Manual High Power Wafer Probe Station

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Manual PS4L Vacuum Wafer Probe Station for High Voltage Test

Manual PS4L High Voltage Vacuum Probe Station

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Automatic PS4L Wafer Prober for Device Characterization

Fully Automatic Wafer Probe Station with Wafer Handler, Inside a Dark Box

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Manual LAB Assistant Wafer Probe Station for Device Characterization

Manual Wafer Probe Station for Device Characterization

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Manual LAB Assistant Wafer Probing System for High Frequency Testing

SemiProbe High Frequency 1021 (m)

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Automatic PS4L Wafer Probe Station for High Frequency 5G Test

Automatic Wafer Probe Station

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Manual PS4L Wafer Probe Station for High Frequency Test

SemiProbe High Frequency Manual Probe Station

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Semiautomatic PS4L Wafer Probe Station for High Frequency Thermal Test

High Frequency Thermal Wafer Probe Station

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Semiautomatic PS4L Wafer Probe Station for Device Characterization

PS4L Semiautomatic Probe Station for Device Characterization

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Further Information

Contact Us

Tel: +44 (0)1264 334505

Email: enquiries@inseto.co.uk

Applications

Semiconductor Wafer Probe, Device Characterization, Packaged Component Test, Optoelectronic Research, Silicon Photonic Components, Power LED’s, VCSELS, Lasers, Photo Diodes etc.

Industry Segments

University Research, Device Development, Semiconductor Fabrication and Production Test

SemiProbe Website

www.semiprobe.com

Region

Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.

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