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Ultra High Vacuum Cryostats

Key Features

  • Extensive range of Ultra High Vacuum Cryostats with customisable interfaces
  • Welded & Stainless Steel Construction with a True-UHV rating (10 -11 mbar)
  • Any Vacuum Flange: Conflat, ISO-F, ISO-K, ISO-KF, or custom flanges
  • Pre-install translators, rotators, custom thermal shields, and extensions
  • Versions designed for ultra low vibrations and ultra high vacuum
  • Versions that can be baked out to 200oC

Ultra High Vacuum (UHV) cryostats by ARS are designed to meet the stringent requirements of surface science, space simulation, quantum materials research, and advanced microscopy. The UHV modification is typically applied to the instrumentation skirt of the cryocooler, allowing for installation in any orientation. To enhance functionality, translators, rotators, custom thermal shields, and extensions can be pre-installed to support a wide range of research applications.

Models:

  • B True HV Variants – ARS cryostats feature a fully-welded flange (Conflat, ISO-F, ISO-K, ISO-KF, or custom), achieving a True-UHV rating of 10⁻¹¹ mbar.
  • X-20 B ULV Variants – For applications demanding ultra-low vibration, UHV-compatible cryostats with specialized vibration isolation are available. These designs not only minimize mechanical noise but also allow the cryocooler to be easily detached without breaking vacuum, enabling chamber bakeout up to 200°C, a crucial feature for maintaining pristine experimental conditions.

Example Applications

Related Products

Further Information

Contact Us

Tel: +44 (0)1264 334505

Email: enquiries@inseto.co.uk

Applications

Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Microfluidic Testing, Photovoltaic Device Test etc.

Industry Segments

Semiconductor Research and Development, Device Characterisation, Production Test, Semiconductor Wafer Probe Test etc.

Region

Finland, Ireland, Norway, Sweden, United Kingdom, etc.

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