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Inseto

Wafer Probe Equipment by SemiProbe

Inseto is proud to supply the full range of wafer probe equipment from SemiProbe, a global innovator and manufacturer of semiconductor probe stations and accessories. Designed for research, development, and production environments, SemiProbe’s wafer probers offer unmatched flexibility, precision, and scalability.

SemiProbe’s wafer probe system are used for testing and characterising semiconductor, microelectronics, MEMS, nanotechnology, microfluidics, optoelectronics, power electronics devices and more.

They solve some of the most difficult wafer probing and device testing challenges by providing application-specific and customized solutions. SemiProbe’s enabling technologies use new innovative designs that are more economical to build, upgrade, use and maintain. They strive to provide industry with access to the latest high quality probing technology to help lower the cost of test.

SemiProbe provides a family of cost-effective wafer prober equipment and accessories to meet a wide variety of applications from R&D to production and from manual through semi and fully automatic, plus custom specific models.

  • Manual, Semiautomatic & Fully Automatic Wafer Probe stations
  • Production & Analytical capabilities, custom configured for your needs and application
  • LAB Assistant platform is an out-of-the-box, low-cost manual probe station
  • PS4L platform is modular and field upgradeable from manual to semi and fully automatic configurations
  • Test individual die, partial through 50, 100, 150, 200 and 300 & 450 mm wafers & substrates
  • Multiple wafer probe applications: High Frequency, Vacuum, High Power, Optoelectronic & MEMS etc.
  • Developed and manufactured by Probing Specialists with a worldwide customer base
Semiprobe Logo

Further Information

Contact Us

Tel: +44 (0)1264 334505

Email: enquiries@inseto.co.uk

What is Wafer Probing?

Wafer probing is a critical step in semiconductor testing, where electrical, optical or other contacts are made directly to the bond pads or test structures on a semiconductor wafer. This process enables engineers and researchers to stimulate the device under test (DUT) to evaluate performance, identify defects, and validate functionality before dicing and packaging.

Key Components of a Wafer Prober:

  • Chuck: Holds the wafer securely
  • Stage: Moves the chuck in X, Y, Z, and Theta (rotation)
  • Manipulators: Position the probes precisely
  • Platen: Supports manipulators and enables probe contact
  • Probe arms (or probe card) & tips: Make direct contact with the DUT
  • Optics: Microscopes and cameras for visual alignment

Inseto Knowledge Base Document:

Read our guide to the “What is a Probe Station and How Does it Work?

Wiki – Wafer Testing Description

Wafer Testing – Wikipedia

Applications:

Semiconductor Research and Development, Device Characterisation, Production Test, Semiconductor Wafer Probe Test etc.

Industry Segments

Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Microfluidic Testing, Photovoltaic Device Test etc.

SemiProbe Website

www.semiprobe.com

Region

Europe, including: Austria, Belgium, Bulgaria, Czechia, Finland, France, Denmark, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.

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