Manual Wafer Probing Systems
SemiProbe offer a range of manual wafer probing systems ideal for Research Centres, Universities, Laboratories and for low volume production environments.
Producing two separate model ranges of manual wafer probing systems, virtually any application including teaching, research, characterization, verification, failure analysis and development can be performed, on a wide variety of semiconductor devices, materials and applications.
The model range comprises:
The mini-Probe-System-for-Life (mini-PS4L) is a modular low cost manual probe station, designed for basic characterization and small sample testing solutions of individual die, up to 100mm diameter devices. The system is available in either manual or semiautomatic configurations.
The LAB Assistant, which is a robust and affordable out-of-the-box manual wafer probing system in a small compact footprint. The equipment is available in DC and HF configurations for probe testing pieces or devices, through 50 to 200 mm wafers. A range of options extend the systems capabilities, including thermal stages, probe card holders and dark boxes etc.
The Probe System For Life (PS4L) is an advanced, modular manual wafer probing system where all of the basics components, including the bases, stages, chucks, microscopes and manipulators, are interchangeable, upgrade-able, and configurable. With its extensive range of hardware and software options, systems can be configured to suit virtually any application or specific probe testing requirements – please see our application specific examples for further details. The PS4L is available in either manual (-M), through semi automatic (-SA) and fully automatic (-FA) configurations.
mini-PS4L Manual Wafer Probe Station
A small footprint and low cost manual wafer probe station ideal for R&D and Universities.
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Lab Assistant Manual Wafer Probe Station
A compact and affordable manual wafer probe station ideal for R&D, Universities and low volume production.
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Manual Wafer Probing System: PS4L-M
Modular manual wafer prober with extensive options and upgrade capability.
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SemiProbe
See the full SemiProbe Wafer Probe Station product range
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Further Information
What is a Manual Wafer Probe Station?
A manual wafer probe station is a precision test system used to electrically probe and characterise semiconductor devices on a wafer or individual die prior to packaging. Probes are positioned manually using high accuracy stages, manipulators, and optical inspection, making the system well suited to research, development, failure analysis, and low volume production environments where operator control and flexibility are important.
Key characteristics of manual wafer probe station include:
- Manual X‑Y stage and probe manipulators providing precise, operator controlled alignment of probe tips to device pads
- High quality optical systems supporting accurate placement for device characterisation and verification tasks.
- Modular and configurable architecture allowing systems to be tailored for DC, HF, MEMS, optoelectronic, and power device testing.
- Manual loading and unloading of wafers and devices being tested
Inseto Knowledge Base Document:
Read our guide to the “What is a Probe Station and How Does it Work?“
Wiki – Wafer Testing Description
Applications
Microelectronic Devices, Multi-Chip-Modules Testing, Semiconductor Wafer Probe, Device Development & Characterisation, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Research Testing, Microfluidic Testing, Photovoltaic Device Test etc.
Industry Segments
Universities, Research Development & Characterisation, Production Test, Semiconductor Production, Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics
SemiProbe Website
Region
Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.
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