Wafer Probe Station – LabAssistant
LAB Assistant Key Features
- Affordable manual wafer probe station
- Test individual die, partial or full wafers
- Probe stations for 50, 100, 150 and 200 mm Wafers
- DC or HF base configurations
- Designed for Universities & Research Applications
- Very simply to setup and operate
- Robust small footprint design
- Extensive options: thermal chucks, dark box, manipulators etc.
The LAB Assistant is an affordable manual wafer probe station designed for research centres, universities, teaching laboratories and low volume production environments. The probe stations feature a robust design in a small footprint and includes all the options required to start manual probing of wafers or devices, “out-of-the-box”.
The LAB Assistant’s range of manual wafer probers are available in either DC or HF configurations, for probing of individual die or partial wafers, through to 200 mm diameter wafers.
An extensive range of additional options and accessories can be added to the systems, including Dark Boxes, Thermal Chucks, CCTV Systems, Manipulators & Probe Arms, Probe Card Holders, Compound Microscopes and Vibration Isolation Tables etc.
LAB Assistant Wafer Probe Station standard features:
- Rigid aluminium base with rubber vibration isolation feet
- 100 x 100 mm Coaxial Microscope Stage
- Trinocular Stereo-zoom Microscope
- DC or HF Manipulators & Probes
- Grooved Vacuum Chuck suitable for die or partial wafers
- Magnetic X-Y-Z Stage with micrometer adjustments
- 360 degree Coarse & 10 degree fine theta adjustment
- Compact small footprint
- Complete system ready to probe out of the box!
LAB Assistant – Manual Probe Station Downloads
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LA-50 LAB Assistant for DC Testing up to 50 mm Wafers
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LA-100 LAB Assistant for DC Testing up to 100 mm Wafers
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LA-150 LAB Assistant for DC Testing up to 150 mm Wafers
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LA-200 LAB Assistant for DC Testing up to 200 mm Wafers
Download
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LA-50 LAB Assistant for HF Testing up to 50 mm Wafers
Download
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LA-100 LAB Assistant for HF Testing up to 100 mm Wafers
Download
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LA-150 LAB Assistant for HF Testing up to 150 mm Wafers
Download
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LA-200 LAB Assistant for HF Testing up to 200 mm Wafers
Download
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SemiProbe Corporate Overview Datasheet
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Example Applications
Manual Probe Station, Device Characterization

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Manual Probe Station, Device Characterization

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Manual Probe Station, High Frequency Test

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Manual Probe Station, Magnetic Stimulation

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Manual Probe Station, High Power Test

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Manual Probe Station, High Frequency Dark Box

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Related Products
Manual Probe System For Life (PS4L-M)

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Semiautomatic Wafer Probers

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Wafer Probe Accessories

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Wafer Scribing Equipment

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Semiconductor Wafers

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Knowledge Base Articles
Description
Description
Glossary of Probing Terms and Acronyms
Link
Description
What is a Probe Station and How Does it Work?
Link
Description
Wafer Probe Tip Selection (IKB-034)
Link
Description
Probe Station Manipulator Overview (IKB-055)
Link
Description
Probe Station Wafer Chuck Guide (IKB-056)
Link
Further Information
Applications
Device Development, Characterisation, Packaged Device Test, Semiconductor Research Testing, Manual Wafer Probing Test
Industry Segments
Universities, Research, Semiconductor, Medical, Photonics, Solar Cell, Optoelectronic, Microwave Electronics, Microelectronics, Power Semiconductor, Power Electronics, MEMS, Spintronics, Carbon Nano Tube, Microfluidic, Photovoltaic etc
SemiProbe Website
Region
Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.
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