Fully Automatic Wafer Probe Equipment: PS4L-FA
PS4L-FA Key Features
- Fully automatic wafer probe test equipment
- Configured according to requirements
- Based on the Probe System for Life (PS4L) Platform
- Cassette or FOUP based handling systems
- Test wafers in manual, semi and fully automatic modes
- Extensive range of options and features
- For production testing of 100, 150, 200 and 300 mm wafers.
SemiProbe provides a family of fully automatic wafer probe equipment with several unique models to choose from. They are robust, high speed solutions for analytical or production wafer probing of semiconductor wafers and are equipped with cassette holders, pre-aligners, and robotic systems with end effectors designed specifically for the application.
The range equipment includes automatic probe systems for 100, 150, 200, 300 mm and 450 mm wafers, with a modular design that enables future upgrades for functionality, or where additional or different test resources and requirements are needed.
The easy to learn and use PILOT™ control software makes the systems simple to set-up, interface to and operate. Software modules can be added to the base system as needed. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs. Communications may be made using RS-232, GPIB or TCP/IP, enabling the system to be either a controller or a slave in an integrated solution.
PS4L-FA Automatic Wafer Probe Equipment features include:
- Multiple applications with the same system: DC, High Frequency, OPTO, MEMS & more
- Handles up to 100, 150, 200 and 300 mm wafers & substrates
- Handles trays of die, wafers or wafers sawn on frames with dual end-effector
- Handles thin & warped wafers from 90 um and above
- Flexible PILOT Control Software Suite – alignment, profiling, wafer map, interfaces and more
- Numerous Options – thermal chucks, optics, bar code reader, OCR, manipulators, probe cards and more
- Production & Analytical capabilities, custom configured for your needs and application
PS4L-FA Automatic Wafer Probe Equipment Downloads
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PS4L-FA Fully Automatic System Overview
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PS4L-FA-4 (100 mm) Fully Automatic Wafer Probing Equipment
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PS4L-FA-6 (150 mm) Fully Automatic Wafer Probing Equipment
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PS4L-FA-8 (200 mm) Fully Automatic Wafer Probing Equipment
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PS4L-FA-12 (300 mm) Fully Automatic Wafer Probing Equipment
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SemiProbe Corporate Overview
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Example Applications
Fully Automatic Probe Station for Characterization

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Fully Automatic 300mm Double Sided Wafer Probe Station

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Fully Automatic Probe Station for Silicon Photonics

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Fully Automatic Vacuum Probe Station for MEMS

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High Vacuum Automatic MEMS Wafer Probe Station

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Fully Automatic MEMS Vacuum Wafer Prober

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Related Products
Probe System For Life (PS4L) Overview

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Manual Probe System For Life (PS4L-M)

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Semiautomatic Probe System For Life (PS4L-SA)

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Application Specific Wafer Probe Equipment

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Wafer Probe Accessories

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Knowledge Base Articles
Description
Description
Glossary of Probing Terms and Acronyms
Link
Description
What is a Probe Station and How Does it Work?
Link
Description
Wafer Probe Tip Selection (IKB-034)
Link
Description
Probe Station Manipulator Overview (IKB-055)
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Description
Probe Station Wafer Chuck Guide (IKB-056)
Link
Further Information
What is a Fully Automatic Wafer Probe Station?
A fully automatic wafer probe station is an advanced piece of semiconductor test equipment used to perform electrical measurements to characterise device performance and verify functionality before wafers are diced and packaged.
The systems automatically handle wafer loading, alignment, probing, testing, and unloading with minimal operator intervention, enabling consistent and repeatable testing in high volume production and advanced development environments.
Key characteristics of fully automatic wafer probe station include:
- Automated wafer handling and alignment using robotic handling systems
- High throughput and repeatability using automation for rapid and consistent probing
- Precise on wafer electrical measurement with repeatable probe and pad contact
- Integration with test software and equipment for automated workflows
Inseto Knowledge Base Document:
Read our guide to the “What is a Probe Station and How Does it Work?“
Wiki – Wafer Testing Description
Applications
Microelectronic Devices, Multi-Chip-Modules Testing, Semiconductor Wafer Probe, Device Development & Characterisation, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Research Testing, Microfluidic Testing, Photovoltaic Device Test etc.
Industry Segments
Universities, Research Development & Characterisation, Production Test, Semiconductor Production, Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics
SemiProbe Website
Region
Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.
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