Bond Test Process Methods
Nordson DAGE is a world leader in developing and manufacturing equipment and test methods for destructive and non-destructive testing of electronic components and precision assemblies.
Machines are used to support research, production, quality assurance or failure analysis in order to qualify new materials or assembly processes, evaluate equipment setup and to determine device reliability and long term performance.
All Nordson-Dage equipment models are capable of the basic bond test methods, including: wire pull, tweezer peel-pull, bond shear and die Shear, including micro-flex bend test etc.
These newer test methods, developed in conjunction with leading institutes and component manufactures are used to ensure reliability and performance in the most challenging electronic assembly applications.
Nordson-DAGE bond test systems can be found in a wide range of industries, including semiconductor, aerospace, automotive, telecommunications, medical, consumer and high reliability etc.
The equipment range and capabilities are as follows:
- 4000 Stellar: Manual wire pull and bond test system
- 4600: Automated wire pull and bond test system
- 4600-W: Automated Wafer level bond tester
- 4000 Plus: Advanced wire pull, bond test capabilities
Click on the images below to see an overview of the different test methods (note, not every method/process is listed) and the respective equipment model the test method is available on.

Bond Test Process Methods and Micro-Materials Test Methods:
Wire Pull Test

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Wire Bond Shear Test

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Passivation Shear Test

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Die Shear Test

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Stud Die Pull Test

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Tweezer Peel – Pull Test

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Hot Bump Pull Test

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Flex-Bend Test

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Related Products
Stellar 4000: Bond Test Equipment

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4600: Automated Bond Test Equipment

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4000 Plus: Advanced Bond Test Equipment

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4600-W Wafer Level Bond Test Equipment

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Knowledge Base Articles
Description
Description
How to Backup DAGE Paragon Database (IKB-004)
Link
Description
How to perform GR&R testing on the Dage 4000 Plus/Optima Platform (IKB-005)
Link
Description
3 and 4 Point Flex Bend Testing (IKB-030)
Link
Description
Dage Hot Bump Pull Testing (IKB-031)
Link
Description
Understanding Shear Test: Ball Bond and Die Shear (IKB-018)
Link
Description
MIL STD 883 Shear Testing (IKB-026)
Link
Description
Understanding Wire Pull Testing (IKB-003)
Link
Description
Peel Testing (IKB-032)
Link
Further Information
Applications
Semiconductor Defect Analysis & Process Characterisation, Wire Bond Testing, Validation Of Process & Machine Setup, In Process Quality Control, Wire Bond Strength Analysis, Materials Testing, Die Shear & Bond Shear Strength Checks, Bump Wafer Test, Micro-Materials Testing, Fatigue, Creep, Flex-Bend, Crush, Push/Pull etc.
Industry Segments
Semiconductor, Automotive, Aerospace, Military, Telecommunications, Medical Electronics, Fibre Optics / Photonic Assembly, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Semiconductor Back-end Assembly, PCB Assembly Industries, Universities, Medical Devices
Nordson-DAGE Website
Region
United Kingdom, Ireland & Scandinavia/Nordic Regions: Finland, Sweden, Norway & Denmark
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