Manual LAB Assistant Wafer Probing System for High Frequency Testing
Specific Requirements:
The customer wanted a small footprint, a multi-purpose manual wafer probing system configured with DC and high frequency (HF) manipulators that could probe devices up to 110 GHz. The system needed to be compact to allow shipping to multiple users. Manipulators with frequency extender mounts needed to be designed to mechanically clamp to SemiProbe as well as competitive probe system platens.
SemiProbe Solution:
- Lab Assistant LA-100 HF manual 100 mm probe system:
- Manual wafer stage with coarse and fine movement
- 100 mm HF chuck with two independent calibration substrate holders
- Large Platen with removable front wedge – stainless steel skin for magnetic-based manipulators
- Microscope Post with Microscope Movement – coaxial – X & Y travel of 100 mm x 100 mm
- Cell Phone Adapter – universal – used to see and capture images with and without a monitor
- Two MA-8500 manual manipulators:
- Clamping bases designed to fit on most probe system platens
- Universal frequency extender modules
- Vacuum pump – small footprint and quiet
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Further Information
Applications
Research, Development, Characterization and Production Test of RF, HF, UHF, VHF and Microwave Devices etc.
Industry Segments
University Research, Development & Characterization, Production Test, Semiconductor Fabrication, Radar Electronics, Microelectronics, Telecommunication, Automotive, Defense etc.
SemiProbe Website
Region
Europe, including: Austria, Belgium, Bulgaria, Czechia, Denmark, Finland, France, Germany, Ireland, Italy, Netherlands, Norway, Poland, Spain, Sweden, Slovakia, Switzerland, Türkiye, United Kingdom, etc.
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